JEOL 2010F STEM
High Resolution Scanning Transmission Electron Microscope
Microscope: JEOL 2010F
Service contractor: EM Control
Manager: Dr. Carroll (carroldl@wfu.edu)
Location: Suite1 Microscopy
The JEOL 2010F
Capabilities
WFU's high resolution capabilities are centered on our JEOL 2010F. This 2003 instrument was rebuilt, refurbished, and upgraded in 2025. The system's analytical capabilities come from EDS X-ray analysis as well as a Gatan image filter (GIF) for EELS and energy filtered imaging. A scanning image observation device (ASID), and several CCD cameras are available for various applications.
With its resolution and stability, the 2010F and its cousins in the 2100F family of microscopes remain some of the highest performing non-aberration corrected microscopes available, ideal for systems in which aberration correction is less necessary such as Chalcogenides, Si, etc. a but high degree of beam stability and energy resolution is desired.
The microscope is managed and maintained by EM Control, a company out of Va with a long history of excellence in microscope management.
Resolution
CTEM 0.10 nm lattice / 0.19 nm point-to-point
STEM 0.16 nm high angle annular dark field (HAADF)
Work Packages
(1) Cameras and Detectors
(i) Gatan MultiScan Camera (model 794) & MultiScan Camera (model 794 IF);
(ii) Fischione HAADF detector
(iii) Oxford Inca EDS detector
(iv) Gatan GIF 2000 EELS spectrometer
(2) Sample holders
(i) JEOL single-tilt holder,
(ii) JEOL double-tilt holder, Model: EM-31041
(iii) GATAN 912 Ultra High Tilt Tomography Holder, Model: 912.J2915,
(iv) GATAN 636 Cooling In-situ Holder, Model: 636-J0915J03.
Si undergoing reconstruction at high temp. on a 2010F at UF